Partner: Łukasz Kurpaska

National Centre for Nuclear Research (PL)

Recent publications
1.Chmielewski M., Nosewicz S., Kurpaska Ł., Romelczyk B., Evolution of material properties during the sintering process of Cr-Re-Al2O3 composites, COMPOSITES PART B-ENGINEERING, ISSN: 1359-8368, DOI: 10.1016/j.compositesb.2016.04.065, Vol.98, pp.88-96, 2016
Abstract:

This paper constitutes an analysis of the effect of heat treatment time on the properties of Cr-Re-Al2O3 composite materials. It was found that as a result of sintering, rhenium is dissolved in chromium to create chromium-rhenium solid solution. This process is time-dependent, therefore as the time extends, the structure of material becomes homogenous, which improves its mechanical properties. Within the frame of herein presented studies, a series of technological tests have been carried out for a constant sintering temperature (1450°C) and pressure (30 MPa), with the use of a variable holding time in the maximum temperature. As a result, changes in the structure of Crsingle bondRe matrix have been determined and the resulting changes in the properties of composite. Based on those tests, optimal conditions of the sintering process have been determined from the point of view of obtaining a homogenous structure and the most beneficial properties of Cr-Re-Al2O3 composites.

Keywords:

Metal-matrix composites (MMCs), Mechanical properties, Mechanical testing, Sintering

Affiliations:
Chmielewski M.-Institute of Electronic Materials Technology (PL)
Nosewicz S.-IPPT PAN
Kurpaska Ł.-National Centre for Nuclear Research (PL)
Romelczyk B.-Warsaw University of Technology (PL)
2.Chrzanowska J., Kurpaska Ł., Giżyński M., Hoffman J., Szymański Z., Mościcki T., Fabrication and characterization of superhard tungsten boride layers deposited by radio frequency magnetron sputtering, CERAMICS INTERNATIONAL, ISSN: 0272-8842, DOI: 10.1016/j.ceramint.2016.04.166, Vol.42, No.10, pp.12221-12230, 2016
Abstract:

The most promising areas of research of new super-hard materials are transition metal borides. These materials are one of the candidates for future superhard layers that will be competitive to DLC and c-BN layers. In this paper MoB-type tungsten boride (WB) layers were examined. WB layers have been deposited by radio frequency magnetron sputtering on Silicon (100), 304 stainless steel (SS 304) and Inconel 601 substrates. Measured thickness of herein prepared layers was about 1 µm, and all studied samples were dense, uniform and smooth. Surface investigation was performed by using an optical profilometer, atomic force microscopy, and scanning electron microscopy. The structure analysis was examined by using X-ray diffractometer (XRD) and transmission electron microscopy (TEM) techniques. Results from the XRD and TEM analysis showed that WB layers were dominated by (101) reflection and indicated a fine grain structure with a grain size of 20–40 nm. The effect of target sputtering power and ambient gas pressure was investigated. The hardness of WB layers deposited on silicon substrate was compared under the load from 1 mN to 5 mN. The hardness of WB layers deposited on SS 304 and Inconel was measured up to 50 mN. All layers of WB revealed excellent hardness exceeding 40 GPa.

Keywords:

Borides, Nanohardness, RF magnetron sputtering, Superhard layers, Tungsten boride

Affiliations:
Chrzanowska J.-IPPT PAN
Kurpaska Ł.-National Centre for Nuclear Research (PL)
Giżyński M.-other affiliation
Hoffman J.-IPPT PAN
Szymański Z.-IPPT PAN
Mościcki T.-IPPT PAN

Conference abstracts
1.Chrzanowska J., Garbiec D., Kurpaska Ł., Denis P., Hoffman J., Mościcki T., Szymański Z., The effect of substrate temperature on the properties of tungsten boride layers deposited by radio frequency magnetron sputtering and pulsed laser deposition, EYEC, 6th European Young Engineers Conference, 2017-04-24/04-26, Warszawa (PL), pp.240-240, 2017
Keywords:

RF magnetron sputtering, hard materials, PLD, tungsten boride

Affiliations:
Chrzanowska J.-IPPT PAN
Garbiec D.-other affiliation
Kurpaska Ł.-National Centre for Nuclear Research (PL)
Denis P.-IPPT PAN
Hoffman J.-IPPT PAN
Mościcki T.-IPPT PAN
Szymański Z.-IPPT PAN