Partner: Cheol Park

NASA Langley Research Center (US)

Ostatnie publikacje
1.Zhao Y., Chen X., Park C., Fay C.C., Stupkiewicz S., Ke C., Mechanical deformations of boron nitride nanotubes in crossed junctions, JOURNAL OF APPLIED PHYSICS, ISSN: 0021-8979, DOI: 10.1063/1.4872238, Vol.115, pp.164305-1-9, 2014


We present a study of the mechanical deformations of boron nitride nanotubes (BNNTs) in crossed junctions. The structure and deformation of the crossed tubes in the junction are characterized by using atomic force microscopy. Our results show that the total tube heights are reduced by 20%–33% at the crossed junctions formed by double-walled BNNTs with outer diameters in the range of 2.21–4.67 nm. The measured tube height reduction is found to be in a nearly linear relationship with the summation of the outer diameters of the two tubes forming the junction. The contact force between the two tubes in the junction is estimated based on contact mechanics theories and found to be within the range of 4.2–7.6 nN. The Young's modulus of BNNTs and their binding strengths with the substrate are quantified, based on the deformation profile of the upper tube in the junction, and are found to be 1.07 ± 0.11 TPa and 0.18–0.29 nJ/m, respectively. Finally, we perform finite element simulations on the mechanical deformations of the crossed BNNT junctions. The numerical simulation results are consistent with both the experimental measurements and the analytical analysis. The results reported in this paper contribute to a better understanding of the structural and mechanical properties of BNNTs and to the pursuit of their applications.

Słowa kluczowe:

Atomic force microscopy, Elastic moduli, Nanotubes, Carbon nanotubes, Finite element methods

Afiliacje autorów:

Zhao Y.-State University of New York at Binghamton (US)
Chen X.-State University of New York at Binghamton (US)
Park C.-NASA Langley Research Center (US)
Fay C.C.-NASA Langley Research Center (US)
Stupkiewicz S.-IPPT PAN
Ke C.-State University of New York at Binghamton (US)