Institute of Fundamental Technological Research
Polish Academy of Sciences


I. Jóźwik

Institute of Electronic Materials Technology (PL)

Recent publications
1.  Jóźwik I., Strojny-Nędza A., Chmielewski M., Pietrzak K., Kurpaska Ł., Nosewicz S., High resolution SEM characterization of nano-precipitates in ODS steels, MICROSCOPY RESEARCH AND TECHNIQUE, ISSN: 1059-910X, DOI: 10.1002/jemt.23004, Vol.81, No.5, pp.502-508, 2018

The performance of the present-day scanning electron microscopy (SEM) extends far beyond delivering electronic images of the surface topography. Oxide dispersion strengthened (ODS) steel is on of the most promising materials for the future nuclear fusion reactor because of its good radiation resistance, and higher operation temperature up to 750°C. The microstructure of ODS should not exceed tens of nm, therefore there is a strong need in a fast and reliable technique for their characterization. In this work, the results of low-kV SEM characterization of nanoprecipitates formed in the ODS matrix are presented. Application of highly sensitive photo-diode BSE detector in SEM imaging allowed for the registration of single nm-sized precipitates in the vicinity of the ODS alloys. The composition of the precipitates has been confirmed by TEM-EDS.

ODS steels, scanning electron microscopy, spark plasma sintering

Jóźwik I. - Institute of Electronic Materials Technology (PL)
Strojny-Nędza A. - Institute of Electronic Materials Technology (PL)
Chmielewski M. - Institute of Electronic Materials Technology (PL)
Pietrzak K. - other affiliation
Kurpaska Ł. - National Centre for Nuclear Research (PL)
Nosewicz S. - IPPT PAN

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