Institute of Fundamental Technological Research
Polish Academy of Sciences


Hubert Grzywacz, MSc

Department of Theory of Continuous Media and Nanostructures (ZTOCiN)
position: lab technician
telephone: (+48) 22 826 12 81 ext.: 209
room: 210

Recent publications
1.  Grzywacz H., Milczarek M., Jenczyk P., Dera W., Michałowski M., Jarząbek D.M., Quantitative measurement of nanofriction between PMMA thin films and various AFM probes, MEASUREMENT, ISSN: 0263-2241, DOI: 10.1016/j.measurement.2020.108267, Vol.168, pp.108267-1-13, 2020

This study reports the quantitative, precise and accurate results of nanoscale friction measurements with the use of an Atomic Force Microscope calibrated with a precise nanoforce sensor. For this purpose, three samples of spin-coated thin Polymethylmethacrylate (PMMA) films were prepared with the following thicknesses: 235, 343, and 513 nm. Three different AFM probes were used for the friction measurements: with diamond-like carbon (DLC) tip with a small (15 nm) or big (2 µm) tip radius, and a reference silicon tip with a small (8 nm) radius. The results show that in all of the studied cases, the coefficient of friction strongly depends on the applied load, being much higher for a lower load. Furthermore, a strong relation of the friction force on the cantilever's geometry, the scanning velocity, and the film thickness was observed.

lateral force microscopy, friction, thin PMMA films, atomic force microscope, DLC coatings, adhesion

Grzywacz H. - other affiliation
Milczarek M. - IPPT PAN
Jenczyk P. - IPPT PAN
Dera W. - IPPT PAN
Michałowski M. - Warsaw University of Technology (PL)
Jarząbek D.M. - other affiliation

Category A Plus


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