Instytut Podstawowych Problemów Techniki
Polskiej Akademii Nauk


Jean-Yves Laval


Ostatnie publikacje
1.  Dłużewski P., Maciejewski G., Jurczak G., Kret S., Laval J.-Y., Nonlinear FE analysis of residual stresses induced by dislocations in heterostructures, COMPUTATIONAL MATERIALS SCIENCE, ISSN: 0927-0256, DOI: 10.1016/j.commatsci.2003.10.012, Vol.29, No.3, pp.379-395, 2004

In this paper the field theory of dislocations is used in the finite element analysis of residual stresses in epitaxial layers. By digital processing of the HRTEM image of a GaAs/ZnTe/CdTe system the tensor maps of dislocation distribution are extracted. Such obtained maps are used as the input data to the finite element code. The mathematical foundations of this code are based on the compatibility equations for lattice distortions. The surface tension induced by misfit dislocations is considered here in terms of a 3D boundary-value problem for stress equilibrium in the interfacial zone. The numerical results show how strongly the surface tension depends on the nonlinear elastic behaviour of the crystal structure.

Słowa kluczowe:
Microscopy and microanalysis techniques, Nonlinear elasticity, Dislocation structure, Finite element analysis, Residual stresses, Layered structures

Afiliacje autorów:
Dłużewski P. - IPPT PAN
Maciejewski G. - IPPT PAN
Jurczak G. - IPPT PAN
Kret S. - Institute of Physics, Polish Academy of Sciences (PL)
Laval J.-Y. - CNRS (FR)

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